SPECTRO MIDEX Micro X-ray Fluorescence Spectrometer for Elemental Analysis: Small Spot, Line Scan and Mapping SPECTRO MIDEX Now in its third generation, the SPECTRO MIDEX X-ray fluorescence spectrometer has developed into an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up to double EC format, 233x160 mm, 9.2x6.3’’). Many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot. The SPECTRO MIDEX X-ray fluorescence spectrometer was developed for these requirements down to the finest details. With input from our customers, it has been extended and optimized. The result is a SPECTRO MIDEX, that sets new standards for analytical performance and ease of use. Application • RoHS compliance screening of parts and assemblies in the electronics industry • The analysis of small components and detection of inclusions in the metal, automotive and aerospace industries • The analysis of jewelry and precious metal alloys • Forensics science applications • Many other tasks where a small measuring spot is required or when the elemental distribution of a larger surface area must be determined. Excitation and Detector Excitation SPECTRO MIDEX utilizes an air-cooled low power X-ray tube with micro focus for collimated point sample excitation. With the incorporation of software controlled collimators, the size of the measuring spot can be selected in several fixed steps between 200 µm and 4 mm; enabling it to be optimized for a whole range of applications. Detector The high resolution detection system consists of a Si drift detector (SDD) with electrical Peltier-cooling. The system processes up to 250,000 pulses per second; making it more than twice as fast as instruments with conventional technology. For a fast point analysis of an unknown sample, it is possible to determine elements from magnesium to uranium in less than 180 seconds. Sample Presentation Sample Presentation The SPECTRO MIDEX is one of the fastest XRF The SPECTRO MIDEX is equipped with a mapping systems commercially available. The spaciously dimensioned sample chamber. entire surface is first measured in a high-speed Even when closed, it is possible to look into the process; a mapping of a double EC board chamber through the viewing window that can (233x160 mm, 9.2x6.3’’) can be completed in also be shuttered. The sample chamber has a less than 30 minutes. In a second step relevant large opening, making it very accessible so that areas can be re-scanned with higher sensitivity. samples can be easily placed into and removed from the chamber. An integrated video system The XYZ table can also be used as a sample permits exact measurment positioning. changer: After the software supported setting The long travel path of the motor driven XYZ of positions, it is possible to automatically table enables line scans and mappings of large measure a large number of samples. Helium sample surfaces. flushing is available for the analysis of light With the optional large working distance of elements. This has no undesired influences on 20 mm from the sample in SPECTRO MIDEX LD the sample, as can be the case when a vacuum (long distance) it is possible to conduct analyses system is used. Because it is only flushed in the of the “valleys” between components. This is immediate area of the measuring spot, the also true for irregularly formed jewelry or, for maximum helium consumption is less than example, examination of the inside of rings. 100 liters per hour. Software Software For accurate analyses of The new user interface allows quick and easy various metal alloys point measurements. Position the sample in SPECTRO MIDEX uses the focus, enter the sample name and start the proprietary FP+ Fundamental analysis. parameter method. RoHS compliance screening can be Setting up a measuring cycle with the optional done for a wide range of xyz-stage is easier than ever. Just place the plastics and composite sample on the tray; a quick step-by-step materials. procedure guides through defining point scans, line scans and mappings. A world of flexibility: – Match analysis method and collimator size to spot selection – Sample spot dependent excitation focussing for uneven surfaces – Customize mappings - pick as many zoom areas on the sample as desired, and save them in any format. – Picture in picture: See the spectrum and where it is coming from With the simple user interface, point measurements are conducted quickly. When defining line scans or mappings, the software guides you through the procedure step-by-step. SPECTRO MIDEX: Technical Specifications SPECTRO MIDEX SD Detection System Environment (2 mm working distance from sample) - Si-drift detector with Peltier cooling: - Ambient temperature: 5-30°C (41-85°F), SPECTRO MIDEX LD Midex SD: 10 mm², Midex LD: 30 mm² specified instrument performance at: (20 mm working distance from sample) - Energy resolution: FWHM <160 eV, 20-25°C (68-77°F) measured at the Mn Kα line with an input - Rel. humidity at 25°C (77°F): 10-80 % Excitation count rate of 10,000 cps non-condensing, free of corrosive vapor and - X-ray tube with Mo anode, - Microprocessor control for detector and high dust pollution max. power 30 W, max. voltage 48 kV read-out electronics - Measurement spot size - Pulse rate up to 250,000 cps *Options Midex SD: 1 mm, Midex LD: 1.2 mm SPECTRO MIDEX SD only Spectrometer Data - He flush for the improvement in detection Sample Chamber - Nominal input voltage: sensitivity for the elements Mg-Cl - Video system with sample display at 95-120V/200-240V, 50/60 Hz - Software-controlled collimators for various zoom levels - Power consumption spectrometer: 200 W measuring spots (in mm): 0.2/0.5/1/2.5/3.3 - Manually adjustable sample table - Dimensions WxDxH: SPECTRO MIDEX LD only - Motor driven XYZ precision table with a 580x670x740 mm/22.8x26.4x29.1“ - Software-controlled collimators for maximum travel path of 235x178x160 mm/ - Footprint WxD: 500x550 mm/19.7x21.6“ measuring spots (in mm): 0.25/0.7/1.2/3.5/4.4 9.3x7.0x5.3“ (WxDxH) maximum sample - Weight 55-70 kg/121.3-154.3 lbs weight of 3 kg/6.6 lbs depending on configuration Evaluation System Analyses - External computer system; Windows - Fundamental Parameters program FP+ operating system for element analysis of alloys - Keyboard, mouse, monitor, printer - Calibration for RoHS compliance screening - Menu-based software for control of of plastics and composite material* spectrometer functions and evaluation of data www.spectro.com GERMANY U.S.A. 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SPECTRO operates worldwide and is present in more than 50 countries. Please contact our headquarters for your local representative. © SPECTRO 2009, Subject to technical modifications • 80902716 • J-9, Photos: SPECTRO, Corbis, Getty Images, Stockxpert.