When results matter SPECTRO XEPOS ED-XRF Spectrometers Introducing a new era in analytical performance SPECTRO XEPOS Redefining ED-XRF analysis with exceptional new levels of performance The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It leads SPECTRO’s newest generation of ED-XRF instruments, providing breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits — yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels of choice. Redesigned operating at critical tasks from rapid screening software provides proven ease analysis to precise product quality and power, while unique new control. Apply it for at-line processing TurboQuant II software quickly and in a variety of applications, such as accurately analyzes practically any petrochemicals, chemicals, envi-unknown liquid, powder, or solid ronmental and geological samples, sample. And SPECTRO XEPOS clinker/cement/slag, cosmetics, food, targeted matrices. An innovative exhibits a significantly lower cost pharmaceuticals, and more. 50 W / 60 kV X-ray tube and unique of investment and ownership than new adaptive excitation technology wavelength dispersive X-ray fluo-Different versions maximize perfor-furnish the highest possible sensi-rescence (WD-XRF) spectrometers. mance for selected element groups in tivity, optimized to target elements 2 SPECTRO XEPOS Extraordinary advantages Spectacular sensitivity Faster measurements Unprecedented Four advanced Compared to previous models, Some users need speed more affordability versions this latest generation of than utmost precision. The instrument incorporates Adaptive excitation and other SPECTRO XEPOS analyzers SPECTRO XEPOS gives them numerous strategies that lower advances let us craft several dramatically improves sensitivity that choice. Operators can its continuing cost of owner- predefined SPECTRO XEPOS — often by 10x or even more! dramatically cut measurement ship: such as low-volume configurations to get the most The difference: SPECTRO times, while still maintaining helium purging for light out of a purchaser’s chosen innovations in adaptive precision levels comparable to elements in liquids and pow- analytical task. Users can excitation plus tube and detector traditional ED-XRF spectrometers. ders, and a vacuum system prioritize measurement speed, technologies. This exceptional The system’s high speed helps for solid samples. Best of all, ultimate precision, or groups sensitivity contributes to achieve analyses of most for many applications, its new of specific elements in boosting precision as well as samples within a few minutes. capabilities mean it can now targeted matrices. realizing significantly lower perform on equal terms with detection levels. So according much more expensive to their needs, users get fast WD-XRF technology. So and accurate analysis of a wide SPECTRO XEPOS users range of elements, from sodium get WD performance at to uranium. an ED price! Na O, rsd 0.1% XEPOS Generation III XEPOS Generation III 2 14.6 Generation I Generation II e G neration II e Generation III Generation 14.44 14.28 O in % Sr 2 14.12 Na 13.96 13.8 SiO , rsd 0.04% 2 74.2 Fe Fe 74.12 in % 74.04 2 73.96 SiO 73.88 6.0 6.0 7.0 7.0 8.0 8.0 13.0 13.0 14.0 14.0 15.0 73.8 E/keV E/keV Day 1 Day 2 Day 3 Day 4 Day 5 Day 6 Day 7 Three generations of SPECTRO XEPOS: Excellent long-term-stability: Glass sample analyzed 35x over the course of 7 days sensitivity trending ever upward Unparalleled precision Lower LODs Unlike most ED-XRF analyzers, SPECTRO XEPOS has always kept Combining advanced components for peak performance, its X-ray tube powered on between measurements, preventing SPECTRO XEPOS deploys its proprietary adaptive excitation on/off variations from affecting readings. This provides excellent technology for optimum effect with its new high-count detector long-term stability, and helps leverage the instrument’s amazing and tube designs. So it can use its new sensitivity and minimized sensitivity to realize an exceptionally high degree of precision in backgrounds to achieve exceptionally low limits of detection elemental analysis — up to 3x better than before. An added (LODs) for a wide range of elements. advantage: substantially improved analytical accuracy for concentrations from trace elements to major components. 3 SPECTRO XEPOS Exciting new technologies Rethinking the X-ray tube One potential weakness of traditional SPECTRO XEPOS employs a new air-design. Its revolutionary binary cobalt/ ED-XRF designs: cycling power off cooled end window X-ray tube — palladium alloy provides extra sensitiv-between each measurement. Resulting a brighter, laboratory-quality exci-ity and lower LODs for specific element temperature variations inevitably tation source optimized for maximum groups. So the instrument can fully real-decrease signal stability. Especially energy generation. ize its advantages in lower LODs, higher with the higher count rates of WD-XRF It remains powered up, even between sensitivity, minimal matrix effect impact, and newer ED-XRF instruments, this measurements, avoiding the instabili-and exceptional accuracy for concen-can complicate analysis, add error, and ty of constant on/off cycling. The tube trations — both high and low — while degrade accuracy. also displays a new thick-target anode attaining substantially longer tube life. Unique binary-alloy anode .......................................................................................... sample tray with samples emits palladium excitation ...................................................................................... polarizer radiation that gives best ......................................................................................... band-pass filter results for sodium to chlorine, ....................................................................................... direct excitation iron to molybdenum, and ................................................................................................................ detection system hafnium to uranium, while emitting cobalt excitation ...................................................................... X-ray tube radiation for potassium to manganese. It’s like having two tubes in one instrument! band-pass filter excitation combined polarized/direct excitation 4 Introducing adaptive excitation To provide precisely targeted analysis to the analyzer’s ultra-high sensitivity optimum excitation conditions for a for each purchaser’s application, and minimal background interference, specified group or groups of elements. SPECTRO XEPOS incorporates for greater precision and lower LODs. The X-ray beam is optimized by fixed revolutionary new adaptive excitation excitation optics with different beam technology. This unique capability is The customer specifies an analysis channels. So each excitation configura-enabled by the instrument’s new task prioritized for either high sample tion can precisely fit the user’s chosen high-resolution detector, together with throughput or best precision. The analytical task. a new readout system. All contribute analyzer is then configured to produce Combined polarized/direct Band-pass filter excitation excitation This configuration This configuration utilizes a uses a polarizer in combina- band-pass filter — a first in tion with direct excitation for commercial ED-XRF analysis optimum analysis of light, — for extra performance in the medium, and heavy elements. element range potassium to manganese. Redesigning the detector The newest generation of In addition, its new high-speed read-SPECTRO XEPOS debuts a new out system provides an ultra-high silicon drift detector (SDD) design. count rate — up to 1 million counts This detector class has delivered per second (cps) — combined with high resolution with low spectral even better resolution than before. interference in previous models. It also contributes to the system’s The newest version possesses an greatly improved peak-to-background enlarged surface (25 mm²) with ratios, extremely low LODs, and maximized active area (17 mm²). ultra-high sensitivity. With improved resolution and peak-to-background, even smaller peaks emerge from the background. SPECTRO XEPOS achieves excellent limits of detection in a wide range of matrices. 5 Simple yet sophisticated software The SPECTRO XRF Analyzer Pro Clearly separated modules offer cover elements in the range from operating software interface used in optimized access to critical sodium to uranium. Analyze lubricating SPECTRO XEPOS has been redesigned information. Once calibrated, oils; low-sulfur fuels; polymers; and optimized — with third-party testing routine analysis is a snap. chemicals; air filters; clinker/cement/ and benchmarking, plus extensive user slag; geological samples; ceramics input — to be exceptionally easy to An array of optional precalibrated and refractories; cosmetics; foods; learn and use. application packages meets many pharmaceuticals; steel and aluminum users’ needs — or lab managers may sheet coatings; environmental samples request their own application-specific like soil or sewage sludge; and more! configurations. Standard analyses Exemplary ease of use Superb analysis of unknown samples A dramatically improved, even more flexible version of a best-in-class SPECTRO g Correlation of Cd in various sample matrices software tool, TurboQuant II is available 10000 only with new SPECTRO XEPOS. It’s 1000 unmatched at screening unknown 100 samples for elements from sodium to uranium, without extensive setup. New 10 TurboQuant II handles an even greater range 1 of samples — now including any type of 0.1 rboQuant II Cd results in mg/k liquids, plus solids from tree leaves to 0.1 1 10 100 1000 10000 Tu plastics, granite to glass — with a single Certified Cd concentration in mg/kg calibration.This revolutionary software takes Electric furnace dust Metalliferous sediment Sewage sludge Granite full advantage of new SPECTRO XEPOS ABS solid disk Metal-rich sediment Blended sediment Beech leaves benefits. It conquers matrix effects (even at low concentration levels), achieves breakthrough speed and precision, and handles previously impossible applications. So TurboQuant II supplies screening results in a few minutes. 6 Maximum flexibility with versatile sample compartment Compared to ICP or flame atomic compartment accepts an optional permits analysis of light elements in absorption spectroscopy (AAS) sample tray with up to 25 positions liquids and powders. SPECTRO XEPOS technologies, ED-XRF requires for maximized productivity. Simply take even offers an optional vacuum system relatively little sample preparation. out the sample tray, and — unlike sin-for economical analysis of pressed And now SPECTRO XEPOS makes gle-sample analyzers — the redesigned powder pellets, fused beads, or solid sample handling more convenient SPECTRO XEPOS also accommodates samples. Another option: both than ever. direct analysis of large and/or irregular-capabilities in a single unit! ly shaped samples. The instrument’s more spacious 372 mm (14.6 in) x 253 mm (9.9 in) x The compartment’s optional 45 mm (1.8 in) measurement low-consumption helium purge Wide array of elemental analysis solutions The flagship of our ED-XRF line, our newest SPECTRO XEPOS spectrometers take their place among today’s most complete suite of advanced elemental analyzers. The XRF suite also features our small-spot SPECTRO MIDEX spectrometer plus our powerful yet portable SPECTROSCOUT and hand-held SPECTRO xSORT models. This line is complemented by our extensive array of ICP-OES instruments, such as the top-of-the-line SPECTRO ARCOS, compact midrange SPECTROBLUE, and “plug-and-analyze” SPECTRO GENESIS. Finally, we provide a full line of both stationary and mobile metal analyzers, including leading brands such as SPECTROLAB, SPECTROMAXx, and SPECTROTEST. Whatever the instrument, SPECTRO‘s experience and innovation ensure superb results. 7 Ultimate confidence with remote monitoring Users talked, and SPECTRO listened. So the newest SPECTRO XEPOS spectrometers extend the instrument’s self-diagnostic functions with AMECARE M2M. This optional machine-to-machine support allows proactive alerts, backed up by direct connection with a remote SPECTRO service expert’s PC. It’s the ultimate in quick, sure response and resolution. Ensured uptime services help make certain that SPECTRO XEPOS analyzers keep up and running for maximum productivity. More than 200 service engineers based in 50+ countries can safeguard uninterrupted performance plus maximum ROI over the instrument’s entire service life. Users can choose proactive performance maintenance, performance upgrades, application solutions, consultation, targeted training, and ongoing support — now including new AMECARE M2M remote monitoring with ongoing diagnostics and alerts. www.spectro.com GERMANY U.S.A. CHINA SPECTRO Analytical SPECTRO Analytical Instruments Inc. AMETEK Commercial Instruments GmbH 91 McKee Drive Enterprise (Shanghai) CO., LTD. Boschstrasse 10, D-47533 Kleve Mahwah, NJ 07430 Part A1, A4 2nd Floor Building No.1 Plot Section Tel: +49.2821.892.0 Tel: +1.800.548.5809 No.526 Fute 3rd Road East; Pilot Free Trade Zone Fax: +49.2821.892.2202 +1.201.642.3000 200131 Shanghai spectro.sales@ametek.com Fax: +1.201.642.3091 Tel.: +86.21.586.851.11 spectro-usa.sales@ametek.com Fax: +86.21.586.609.69 spectro-china.sales@ametek.com Subsidiaries: uHONG KONG: Tel. +852.2976.9162, Fax +852.2976.9132, spectro-ap.sales@ametek.com, uFRANCE: Tel +33.1.3068.8970, Fax +33.1.3068.8999, spectro-france.sales@ametek.com, uGREAT BRITAIN: Tel +44.1162.462.950, Fax +44.1162.740.160, spectro-uk.sales@ametek.com, uINDIA: Tel +91.22.6196 8200, Fax +91.22.2836 3613, sales.spectroindia@ametek.com, uITALY: Tel +39.02.94693.1, Fax +39.02.94693.650, spectro-italy.sales@ametek.com, uJAPAN: Tel +81.3.6809.2405, Fax +81.3.6809.2410, spectro-japan.info@ametek.co.jp, uSOUTH AFRICA: Tel +27.11.979.4241, Fax +27.11.979.3564, spectro-za.sales@ametek.com, uSWEDEN: Tel +46.8.5190.6031, Fax+46.8.5190.6034, spectro-nordic.info@ametek.com. uSPECTRO operates worldwide and is present in more than 50 countries. For SPECTRO near you, please visit www.spectro.com/worldwide © 2016 AMETEK Inc., all rights reserved, subject to technical modifications • A-16, Rev. 1 • 80902732• Photos: SPECTRO and thinkstock• Registered trademarks of SPECTRO Analytical Instruments GmbH • : USA (3,645,267); EU (005673694); “SPECTRO”: EU (009693763); “SPECTRO XEPOS”: Germany (39851192), USA (2,415,185)