SPECTRO MIDEXMID05 SMALL-SPOT ED-XRF SPECTROMETER FOR PRECIOUS METALS TESTING The smart alternative to fire assay — now with new, improved sensitivity and speed The fifth generation of fast, accurate analysis for precious metals SPECTRO MIDEX Accuracy of elemental analysis is often critical — especially in assessing precious metals. Remelted samples from reclaimed/recycled alloys may contain other elements besides the expected gold, silver, copper, or platinum. Assayers and refiners need instruments with the sensitivity to detect and precisely analyze even minor or trace amounts, to assess true composition and value. Other users may prioritize speed. High-volume hallmarking centers demand both fast and accurate analysis. In addition, all users prefer analyzers that are robust, convenient, and easy to operate, with helpful software and easy transfer of results into a lab network. In dealing with precious metals, of course, users also prize nondestructive sampling. The energy dispersive X-ray fluorescence analysis (ED-XRF) meets these requirements. Finally, ED-XRF can alert users to digestion-resistant alloys such as platinum/iridium mixtures. For years, SPECTRO MIDEX has turned in ultra-reliable, top-rated XRF performance in all these areas. It’s the industry standard in many assay laboratories worldwide. Now a fifth generation of SPECTRO MIDEX analyzers — with up to triple the point analysis sensitivity of previous models — approaches fire assay technology in precision, while greatly surpassing it in speed and ease. And it’s fully optimized for precious metals applications. SPECTRO MIDEX SMALL-SPOT ENERGY-DISPERSIVE X-RAY FLUORESCENCE (ED-XRF) ANALYZER The compact new SPECTRO MIDEX incorporates the latest developments in ED-XRF detector technology, using high count rate and high resolution. These innovations help make it one of the most advanced laboratory XRF benchtop analyzers available for precious metals testing. So users can choose significantly increased precision — even for minor and trace element content — or substantially faster testing for higher sample throughput. EXCEPTIONAL PERFORMANCE EXCELLENT EASE OF USE COMPETITIVE COST Analyzing precious metals alloys, Operation is easy even for minimally SPECTRO MIDEX provides high-reliability, SPECTRO MIDEX provides high precision trained operators. Intuitive software cost-effective analysis for precious metals and accuracy for a wide range of presents relevant information on one testing offices, assay labs, hallmarking concentration levels — plus record-setting screen. An integrated video system aids in centers, and refinery labs. Its accuracy testing times (as low as 15 seconds). For sample positioning and documenting the and speed reduce costly additional fire small jewelry items or drill cuttings from testing spot. Analysis starts with a single assay, or ICP-OES testing that requires remelted samples, it analyzes a small spot screen click — or one touch of the new sample digestion. (typically 1.2 mm). For silver samples, instrument-mounted start/stop button. which may be relatively inhomogeneous, Display, printout, and transfer of analysis averaged results from an optional larger results support later data use and/or proof spot size maintain high-accuracy results. of compliance. SPECTRO MIDEX Technology takes the next step One drawback of some XRF analyzers is their inability to detect minor and trace amounts of some nonprecious elements. This may render them incapable of precisely determining the content of major precious metals such as gold, silver, and platinum. Example: in a gold alloy sample, failing to detect ten minor elements, each at 0.05%, could produce an erroneous — and expensive — 0.5% higher total for gold. Fortunately, SPECTRO MIDEX excels at this type of challenging analysis. And its newest high-resolution silicon drift detector (SDD) makes determination of trace and minor elements even more accurate. Adding to that precision is our newest ultra-high count rate. With the same measurement time as previous-generation models, it delivers up to 3X higher intensities. Alternatively, SPECTRO MIDEX users who prefer speed can perform an accurate analysis within only 15 seconds. MORE COMPACT, ROBUST DESIGN Per customer requests, a significantly smaller housing fits tighter benchtop spaces, yet accommodates samples from tiny jewelry pins to large silver pieces. The sample door glides easily upward without disturbing items on the bench. Ruggedizing redesigns eliminate any fragile mirrors and protect the detector window. An internal laboratory jack positions the sample for precise measurement. GLOBAL SUPPORT Jewelry assayers and recycling operations depend on the availability of accurate analysis for productivity — and profitability. To ensure that reliable SPECTRO MIDEX analyzers keep up the pace, SPECTRO offers the AMECARE Performance Services program. Customers report unmatched levels of coverage, application knowledge, and uptime. More than 200 AMECARE service engineers in 50 countries help ensure peak performance and extended life for every SPECTRO MIDEX instrument. AMECARE’s high-value, customized services include proactive maintenance programs; application solutions; access to specialists; and instrument-specific training. SPECTRO MIDEX Technical Specifications FULL FAMILY OF ANALYZERS Detector Silicon Drift Detector (SDD) Excitation 40 W X-ray tube, molybdenum (Mo) anode, 50 kV max. SPECTRO provides one of the Dimensions industry’s most comprehensive suites Height 540 mm (21.2 in) of advanced elemental analyzers. Width 555 mm (21.8 in) Devices particularly suited for jewelry Depth 470 mm (18.5 in) and recycling applications include Weight ca. 50 kg (~ 110 lbs) Sample Video system to display sample image the high-end SPECTRO XEPOS Chamber Manually adjustable sample table benchtop XRF analytical instrument; Power Operating voltage 95-120 V / 200-240 V, 50/60 Hz the midrange, versatile SPECTRO Supply Power consumption of spectrometer: 200 W MIDEX benchtop small-spot XRF Evaluation External computer system; Windows operating system spectrometer; the portable yet system keyboard, mouse, monitor, printer powerful SPECTROSCOUT ED-XRF Software Menu-based software for control of spectrometer functions and evaluation of data Analyses Fundamental Parameters program FP+ for elemental analysis of alloys spectrometer; and the SPECTRO Options Collimator changer to realize different spot sizes and excitation conditions xSORT handheld XRF spectrometer. Whatever the product, SPECTRO’s more than 30 years of experience in elemental analysis and unparalleled record of technological innovation ensure the best results in the business. www.spectro.com GERMANY U.S.A. CHINA SPECTRO Analytical Instruments GmbH SPECTRO Analytical Instruments Inc. AMETEK Commercial Boschstrasse 10 91 McKee Drive Enterprise (Shanghai) CO., LTD. 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For SPECTRO near you, please visit www.spectro.com/worldwide. © 2017, by AMETEK,Inc. all rights reserved. Subject to modifications • 80902733 • G-17, Rev.1. Photos: SPECTRO, Adobe Stock, Getty Images, iStockphoto. Registered trademarks of SPECTRO Analytical Instruments GmbH : USA (3,645,267); EU (005673694); “SPECTRO”: EU (009693763); iCAL: USA (3,189,726), EU (003131919); “MIDEX”: Germany (30315393); EU (003131984); USA (2,864,548); “SPECTROSCOUT”: EU (10705424); USA (4,394,468); Japan (1141441); South Korea (1141441); China (1141441); “XEPOS”: Gemany (39851192); USA (2,415,185); “xSORT”: USA (IR 3,767,555); Japan, China (IR 978 588); EU (007058456).