SPECTRO MIDEX SMALL SPOT ED-XRF SPECTROMETER Elemental analysis for small-spot, line scan, and mapping applications Fast and accurate elemental analysis plus compliance screening SPECTRO MIDEX Many elemental analysis tasks in industry, research, and the sciences require a nondestructive system that’s extremely sensitive and capable of focused small-spot measurement. The SPECTRO MIDEX XRF spectrometer meets and exceeds these requirements. It offers fast, nondestructive elemental analysis of small spots, plus rapid mapping of large surfaces, including double-format printed circuit boards (PCBs). For years, SPECTRO MIDEX has turned in top-rated XRF performance. Recently optimized, the improved SPECTRO MIDEX analyzer sets new standards for analytical performance. Ideal applications include compliance screening for RoHS and similar regulatory directives; the analysis of small components plus detection of inclusions in the metal, automotive, and aerospace industries; elemental analysis in forensics science; and many similar mission-critical tasks. SPECTRO MIDEX SMALL-SPOT ENERGY-DISPERSIVE X-RAY FLUORESCENCE (ED-XRF) ANALYZER SPECTRO MIDEX incorporates the latest high-spectral-resolution detector technology, plus a greatly improved count rate. These innovations make it one of the most advanced midrange laboratory XRF benchtop analyzers available for small-spot elemental analysis, plus line scanning and mapping. It lets users choose significantly increased accuracy — even for trace elements — or substantially accelerated testing times for higher sample throughput. EXCEPTIONAL PERFORMANCE For regulatory compliance applications, SPECTRO MIDEX provides fast screening of elements such as chromium, bromine, cadmium, mercury, and lead. An optional collimator changer varies the spot size to fit the required analysis area. For specialized industrial applications, an optional XYZ sample tray — together with maximum 4 x 4 mm spot size — allows ultra-fast large-area mapping. Areas of concern can then be analyzed in detail with a smaller spot. And in forensics science, applications range from the analysis of tiny fragments to the mapping of larger samples for gunshot residues. SPECTRO MIDEX Fast elemental screening For accurate analyses of metal alloys, SPECTRO MIDEX applies its proprietary FP+ fundamental parameter method for alloy testing. For compliance screening applications it provides an optimized RoHS calibration covering a wide range of elements and matrices. For unknown samples, a fast point analysis can determine concentrations of typical and important elements in the range from magnesium to uranium in less than 180 seconds. A spacious chamber features a large, easy-access opening for sample placement and removal. An integrated video system aids in exact measurement positioning. For irregular shapes (components with “valleys,” high-relief jewelry, ring inner surfaces, etc.), an optional 20 mm working distance permits focusing on sample points at varying heights. The long travel path of an optional motor-driven XYZ table enables line scans and mappings of large sample surfaces. (Table can also be used as a sample changer, with software-based position settings enabling automatic measurements of large numbers of samples.) SPECTRO MIDEX is one of the fastest XRF mapping systems commercially available. The entire sample surface is measured in a high-speed process; mapping of a Eurocard-format double PCB can be completed in less than 30 minutes. Relevant areas can then be rescanned with even higher spatial resolution. EXCELLENT EASE OF USE Intuitive software supplies all relevant information on a single screen, guiding the user through each task. The integrated video system aids in accurate sample positioning and can help document the testing spot. For line scan and mapping, users simply position the sample, adjust the sample height, define the area of interest; and then start the analysis. Display, printout, and transfer of analysis results support later data use and/or proof of compliance. GLOBAL SUPPORT Many applications in industry, research, and the sciences depend on the availability of accurate analysis for productivity — and often for profitability. To ensure that SPECTRO MIDEX analyzers keep up the pace, SPECTRO offers the AMECARE Performance Services program. More than 200 AMECARE service engineers in 50 countries help ensure peak performance and extended life for every SPECTRO MIDEX instrument. AMECARE’s high-value, customized services include proactive maintenance programs; application solutions; access to specialists; and instrument-specific training. SPECTRO MIDEX Technical Specifications SPECTRO MIDEX available in two configuration FULL FAMILY OF ANALYZERS SPECTRO MIDEX SD (2 mm working distance from sample) SPECTRO provides one of the most SPECTRO MIDEX LD (20 mm working distance from sample) Detector SDD comprehensive suite of advanced Excitation X-ray tube, molybdeum (Mo) anode, 48 kV max. elemental analyzers. Devices Dimensions particularly suited for jewelry and Height 740 mm (29.1 in) recycling applications include the Width 580 mm (22.8 in) high-end SPECTRO XEPOS benchtop Depth 670 mm (26.4 in) analytical instrument; the midrange, Weight 55 - 70 kg (121 - 154 lbs) depending on configuration Sample Video system to display sample image versatile SPECTRO MIDEX benchtop Chamber Manually adjustable sample table small-spot XRF spectrometer; the Power Operating voltage 95-120V/200-240V, 50/60 Hz portable yet powerful SPECTROSCOUT Supply Power consumption spectrometer: 200 W ED-XRF spectrometer; and the Evaluation External computer system; Windows operating system SPECTRO xSORT handheld XRF system keyboard, mouse, monitor, printer spectrometer. Software Menu-based software for control of spectrometer functions and evaluation of data Analyses Fundamental Parameters program FP+ for element analysis of alloys Calibration for RoHS compliance screening of plastics and composite material Whatever the product, SPECTRO’s Options Motor driven XYZ precision table with a maximum travel path of more than 30 years of experience in 240x178x160 mm/ 9.4x7.0x5.3“ (WxDxH) maximum sample weight of 3 kg/6.6 lbs elemental analysis and unparalleled SPECTRO MIDEX SD only record of technological innovation He flush for the improvement in detection sensitivity for the elements Mg-Cl ensure the best results in the business. Software-controlled collimators for measuring spots (in mm): 0.2/0.5/1/2.5/3.3 SPECTRO MIDEX LD only Software-controlled collimators for measuring spots (in mm): 0.25/0.7/1.2/3.5/4.4 www.spectro.com GERMANY U.S.A. CHINA SPECTRO Analytical Instruments GmbH SPECTRO Analytical Instruments Inc. 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SPECTRO operates worldwide and is present in more than 50 countries. For SPECTRO near you please visit www.spectro.com/worldwide. © 2016, by AMETEK,Inc. all rights reserved. Subject to modifications • 80902734 • H-16, Rev.0. Photos: SPECTRO, Corbis, Getty Images, iStockphoto. Registered trademarks of SPECTRO Analytical Instruments GmbH : USA (3,645,267); EU (005673694); “SPECTRO”: EU (009693763); iCAL: USA (3,189,726), EU (003131919); “MIDEX”: Germany (30315393); EU (003131984); USA (2,864,548); “SPECTROSCOUT”: EU (10705424); USA (4,394,468); Japan (1141441); South Korea (1141441); China (1141441); “XEPOS”: Gemany (39851192); USA (2,415,185); “xSORT”: USA (IR 3,767,555); Japan, China (IR 978 588); EU (007058456).